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arXiv 1706.01422cond-mat.mtrl-scicond-mat.mes-hall
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准自支撑单层石墨烯中Si悬挂键的原子和电子结构

Atomic and Electronic Structure of Si Dangling Bonds in Quasi-Free-Standing Monolayer Graphene

Yuya Murata, Tommaso Cavallucci, Valentina Tozzini, Niko Pavliček, Leo Gross, Gerhard Meyer, Makoto Takamura, Hiroki Hibino, Fabio Beltram, Stefan Heun

摘要:

在准自立单层石墨烯(QFMLG)的界面处没有H终止的Si悬挂键是已知的散射中心,其可以严重影响载流子迁移率。在这份报告中,我们研究的原子和电子结构的Si悬挂键QFMLG使用低温扫描隧道显微镜/光谱(STM/STS),原子力显微镜(AFM),和密度泛函理论(DFT)计算。利用扫描隧道显微镜(STM)和原子力显微镜(AFM)在平台上观察到两种不同对比度的缺陷。它们的STM对比度随偏置电压而变化。在STS中,它们在不同的能量1.1和1.4 eV处显示出特征峰。与DFT计算的比较表明,它们分别对应于3和4 Si悬挂键的簇。这些结果的优化石墨烯合成的相关性进行了讨论。

英文摘要:

Si dangling bonds without H termination at the interface of quasi-free standing monolayer graphene (QFMLG) are known scattering centers that can severely affect carrier mobility. In this report, we study the atomic and electronic structure of Si dangling bonds in QFMLG using low-temperature scanning tunneling microscopy/spectroscopy (STM/STS), atomic force microscopy (AFM), and density functional theory (DFT) calculations. Two types of defects with different contrast were observed on a flat terrace by STM and AFM. Their STM contrast varies with bias voltage. In STS, they showed characteristic peaks at different energies, 1.1 and 1.4 eV. Comparison with DFT calculations indicates that they correspond to clusters of 3 and 4 Si dangling bonds, respectively. The relevance of these results for the optimization of graphene synthesis is discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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