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arXiv 1702.01148cond-mat.mtrl-sci
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碳纳米管场效应晶体管电特性温度依赖性的量子模拟研究

Temperature Dependence of Electrical Characteristics of Carbon Nanotube Field-Effect Transistors: A Quantum Simulation Study

Ali Naderi, S. Mohammad Noorbakhsh, Hossein Elahipanah

摘要:

采用二维全量子模拟方法,对碳纳米管场效应晶体管在不同温度下的特性进行了全面的研究。采用自洽解二维Poisson-Schrodinger方程的非平衡格林函数(NEGF)的形式主义进行了模拟。研究了CNTF晶体管的电流容量、漏电导、漏电流、亚阈值摆幅等主要特性。模拟结果表明,在250 ~ 500 K温度范围内,CNTFET的漏电导和导通电流随温度的升高而增大。与此同时,由于关断电流增长加快,开断电流比率恶化。此外,温度对短沟道效应(SCE),如漏致势垒降低(DIBL)和阈值电压滚降的影响进行了研究。结果表明,亚阈值摆幅与DIBL参数几乎呈线性相关,因此这些参数的退化具有相同的根源,并能很好地受温度的影响。

英文摘要:

By developing a two-dimensional (2D) full quantum simulation, the attributes of carbon nanotube field-effect transistors (CNTFETs) in different temperatures have been comprehensively investigated. Simulations have been performed by employing the self-consistent solution of 2D Poisson-Schrodinger equations within the nonequilibrium Green's function (NEGF) formalism. Principal characteristics of CNTFETs such as current capability, drain conductance, transconductance, and subthreshold swing (SS) have been investigated. Simulation results present that the drain conductance and on-current of the CNTFET increases as temperature raises from 250 to 500 K. Meanwhile the on-/off-current ratio deteriorated due to faster growth in off-current. Also the effects of temperature on short channel effects (SCEs) such as drain-induced barrier lowering (DIBL) and threshold voltage roll-off have been studied. Results show that the subthreshold swing and DIBL parameters are almost linearly correlated, so the degradation of these parameters has the same origin and can be perfectly influenced by the temperature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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