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arXiv 0705.3407cond-mat.mtrl-sci
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纳米管晶体管电子能带结构的扫描光电流显微术研究

Electronic Band Structure Mapping of Nanotube Transistors by Scanning Photocurrent Microscopy

E. J. H. Lee, K. Balasubramanian, J. Dorfmueller, R. Vogelgesang, N. Fu, A. Mews, M. Burghard, K. Kern

摘要:

报道了碳纳米管场效应晶体管(CNFET)在不同输运状态下的空间分辨光电流测量结果。它表明,在不同的偏置条件下测量的光电流提供访问的电子能带结构的纳米管通道的轮廓。将器件转换为n型或p型状态的曲线进行比较,清楚地证明了环境中化学掺杂的影响。此外,我们表明,扫描光电流显微镜构成了一个有效的和简便的技术,定量测定在这样的设备中的肖特基势垒高度。

英文摘要:

Spatially resolved photocurrent measurements on carbon nanotube field-effect transistors (CNFETs) operated in various transport regimes are reported. It is demonstrated that the photocurrents measured at different biasing conditions provide access to the electronic band structure profile of the nanotube channel. A comparison of the profiles with the device switched into n- or p-type states clearly evidences the impact of chemical doping from the ambient. Moreover, we show that scanning photocurrent microscopy constitutes an effective and facile technique for the quantitative determination of the Schottky barrier height in such devices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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