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arXiv 1608.01941cond-mat.mtrl-sci
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CuMnAs薄膜反铁磁体Neel矢量的光学测定

Optical determination of the Neel vector in a CuMnAs thin-film antiferromagnet

V. Saidl, P. Nemec, P. Wadley, V. Hills, R. P. Campion, V. Novak, K. W. Edmonds, F. Maccherozzi, S. S. Dhesi, B. L. Gallagher, F. Trojanek, J. Kunes, J. Zelezny… 展开作者

V. Saidl, P. Nemec, P. Wadley, V. Hills, R. P. Campion, V. Novak, K. W. Edmonds, F. Maccherozzi, S. S. Dhesi, B. L. Gallagher, F. Trojanek, J. Kunes, J. Zelezny, P. Maly, T. Jungwirth

摘要:

近年来,反铁磁体的电学探测和操控技术的突破为非易失性自旋电子器件的研究开辟了一条新的途径。反铁磁体中的反平行自旋亚晶格产生零偶极场,导致对磁场扰动的不敏感性、多能级稳定性、超快自旋动力学和其他有利的特性,这些特性可以在从磁存储到光信号处理的领域中找到应用。然而,由于缺乏净磁矩和极短的磁化动力学时间尺度,反铁磁体很难通过普通磁力计或磁共振技术进行研究。在本文中,我们证明了实验测定的Neel矢量的反铁磁CuMnAs的薄膜,这是第一次实现反铁磁存储芯片中使用的突出材料。我们采用了基于磁线性二向色性的飞秒泵浦-探测磁光实验。这种桌面光学方法比传统的大型设备技术,如中子衍射和X射线磁二向色性测量更容易获得。这种光学技术允许一个明确的直接确定的Neel矢量取向的反铁磁薄膜中利用的设备直接从测量数据,而不拟合的理论模型。

英文摘要:

Recent breakthroughs in electrical detection and manipulation of antiferromagnets have opened a new avenue in the research of non-volatile spintronic devices. Antiparallel spin sublattices in antiferromagnets, producing zero dipolar fields, lead to the insensitivity to magnetic field perturbations, multi-level stability, ultra-fast spin dynamics and other favorable characteristics which may find utility in fields ranging from magnetic memories to optical signal processing. However, the absence of a net magnetic moment and the ultra-short magnetization dynamics timescales make antiferromagnets notoriously difficult to study by common magnetometers or magnetic resonance techniques. In this paper we demonstrate the experimental determination of the Neel vector in a thin film of antiferromagnetic CuMnAs which is the prominent material used in the first realization of antiferromagnetic memory chips. We employ a femtosecond pump-probe magneto-optical experiment based on magnetic linear dichroism. This table-top optical method is considerably more accessible than the traditionally employed large scale facility techniques like neutron diffraction and X-ray magnetic dichroism measurements. This optical technique allows an unambiguous direct determination of the Neel vector orientation in thin antiferromagnetic films utilized in devices directly from measured data without fitting to a theoretical model.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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