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arXiv 1602.03576cond-mat.mtrl-scicond-mat.str-elcond-mat.supr-con
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ZrTe5中温度诱导Lifshitz相变的电子证据及其拓扑性质

Electronic Evidence of Temperature-Induced Lifshitz Transition and Topological Nature in ZrTe5

Yan Zhang, Chenlu Wang, Li Yu, Guodong Liu, Aiji Liang, Jianwei Huang, Simin Nie, Yuxiao Zhang, Bing Shen, Jing Liu, Hongming Weng, Lingxiao Zhao, Genfu Chen, X… 展开作者

Yan Zhang, Chenlu Wang, Li Yu, Guodong Liu, Aiji Liang, Jianwei Huang, Simin Nie, Yuxiao Zhang, Bing Shen, Jing Liu, Hongming Weng, Lingxiao Zhao, Genfu Chen, Xiaowen Jia, Cheng Hu, Ying Ding, Shaolong He, Lin Zhao, Fengfeng Zhang, Shenjin Zhang, Feng Yang, Zhimin Wang, Qinjun Peng, Xi Dai, Zhong Fang, Zuyan Xu, Chuangtian Chen, X. J. Zhou

摘要:

拓扑材料是近年来研究的热点。虽然三维拓扑绝缘体越来越丰富,但二维拓扑绝缘体仍然很少见,特别是在天然材料中。ZrTe 5的反常输运性质一直是一个长期存在的难题;其潜在的起源仍然难以捉摸。最近,由于单层ZrTe 5是一个二维拓扑绝缘体,体相ZrTe 5中可能存在拓扑相变,因此重新引起了人们的兴趣。然而,ZrTe 5的拓扑性质仍有争议,因为一些实验指出它是三维或准二维狄拉克半金属。在这里,我们报告高分辨率的激光为基础的角分辨光电发射测量的ZrTe 5。ZrTe_5的电子性质主要由布里渊区中心的两个近线性色散带支配。这两个带被一个能隙分开,该能隙随着温度的降低而减小,但持续到我们测量的最低温度(~2 K)。整体电子结构表现出显着的温度依赖性;它从高温下具有空穴状费米口袋的p型半金属演变为约135 K的半导体,其电阻率呈现峰值,再到低温下具有电子状费米口袋的n型半金属。这些结果表明,在ZrTe 5的温度诱导的Lifshitz转变的明确的电子证据。他们提供了一个自然的理解的基本起源的电阻率异常在~135 K及其相关的反转的载流子型。我们的观察也提供了关键信息破译的拓扑性质的ZrTe 5和可能的温度诱导的拓扑相变。

英文摘要:

The topological materials have attracted much attention recently. While three-dimensional topological insulators are becoming abundant, two-dimensional topological insulators remain rare, particularly in natural materials. ZrTe5 has host a long-standing puzzle on its anomalous transport properties; its underlying origin remains elusive. Lately, ZrTe5 has ignited renewed interest because it is predicted that single-layer ZrTe5 is a two-dimensional topological insulator and there is possibly a topological phase transition in bulk ZrTe5. However, the topological nature of ZrTe5 is under debate as some experiments point to its being a three-dimensional or quasi-two-dimensional Dirac semimetal. Here we report high-resolution laser-based angle-resolved photoemission measurements on ZrTe5. The electronic property of ZrTe5 is dominated by two branches of nearly-linear-dispersion bands at the Brillouin zone center. These two bands are separated by an energy gap that decreases with decreasing temperature but persists down to the lowest temperature we measured (~2 K). The overall electronic structure exhibits a dramatic temperature dependence; it evolves from a p-type semimetal with a hole-like Fermi pocket at high temperature, to a semiconductor around ~135 K where its resistivity exhibits a peak, to an n-type semimetal with an electron-like Fermi pocket at low temperature. These results indicate a clear electronic evidence of the temperature-induced Lifshitz transition in ZrTe5. They provide a natural understanding on the underlying origin of the resistivity anomaly at ~135 K and its associated reversal of the charge carrier type. Our observations also provide key information on deciphering the topological nature of ZrTe5 and possible temperature-induced topological phase transition.

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