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arXiv 1602.01419cond-mat.mtrl-sci
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通过等离子体辅助分子束外延实现的液态金属赋能含铝III族氮化物合成

Liquid-Metal-Enabled Synthesis of Aluminum-Containing III-Nitrides by Plasma-Assisted Molecular Beam Epitaxy

Yu-Han Liang, T. Nuhfer, Elias Towe

AI总结:

针对富铝氮化物薄膜结晶质量差、p型掺杂难的问题,提出液态金属赋能的等离子体辅助分子束外延法,实现了高结晶质量、高掺杂的含铝氮化物薄膜生长,为高性能光电器件提供支撑。

摘要:

氮化物薄膜在先进光电子和电子器件应用中颇具前景。然而,一些挑战仍在阻碍高含铝量器件的发展。两大主要难点分别是生长富铝组分的高结晶质量薄膜,以及对这类薄膜进行高效p型掺杂。这些问题已严重限制了通过分子束外延生长的富铝氮化物薄膜的应用。解决这些问题的一种途径是采用液态金属赋能的分子束外延方法。尽管生长前沿存在液态金属层的情况让人联想到传统的液相外延,但该方法的细节与之不同。传统液相外延是一种近热力学平衡过程,而液态金属辅助分子束外延并非如此。富铝氮化物的生长主要由分子蒸气通量的动力学,以及吸附原子在并入晶格前通过液态金属层的表面扩散所驱动。本文报道了高结晶质量、高掺杂含铝氮化物薄膜的生长情况。测得的光学和电学表征数据表明,该方法可用于生长原子级光滑的含铝氮化物异质结。在Al₀.₇Ga₀.₃N薄膜中实现了高达6×10¹⁷ cm⁻³的极高p型掺杂,以及高达1×10²⁰ cm⁻³的n型掺杂。预计这类富金属条件的应用将对需要同时具备高结晶质量和高掺杂(Al,Ga)N薄膜的高效率、高功率光电子及电子器件产生重大影响。

英文摘要:

Nitride films are promising for advanced optoelectronic and electronic device applications. However, some challenges continue to impede development of high aluminum-containing devices. The two major difficulties are growth of high crystalline quality films with aluminum-rich compositions, and efficiently doping such films p-type. These problems have severely limited use of aluminum-rich nitride films grown by molecular beam epitaxy. A way around these problems is through use of a liquid-metal-enabled approach to molecular beam epitaxy. Although the presence of a liquid metal layer at the growth front is reminiscent of conventional liquid phase epitaxy, this approach is different in its details. Conventional liquid epitaxy is a near-thermodynamic equilibrium process which liquid-metal assisted molecular beam epitaxy is not. Growth of aluminum-rich nitrides is primarily driven by the kinetics of the molecular vapor fluxes, and the surface diffusion of adatoms through a liquid metal layer before incorporation. This paper reports on growth of high crystalline quality and highly doped aluminum-containing nitride films. Measured optical and electrical characterization data show that the approach is viable for growth of atomically smooth aluminum-containing nitride heterostructures. Extremely high p-type doping of up to $6 \times 10$$^{17}$ cm$^{-3}$ and n-type doping of up to $1 \times 10$$^{20}$ cm$^{-3}$ in Al$_{0.7}$Ga$_{0.3}$N films was achieved. Use of these metal-rich conditions is expected to have a significant impact on high efficiency and high power optoelectronic and electronic devices that require both high crystalline quality and highly doped (Al,Ga)N films.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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