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arXiv 1505.07970cond-mat.mes-hallcond-mat.mtrl-sci
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几层HfS2 FET

Few Layer HfS2 FET

Toru Kanazawa, Tomohiro Amemiya, Atsushi Ishikawa, Vikrant Upadhyaya, Kenji Tsuruta, Takuo Tanaka, Yasuyuki Miyamoto

摘要:

2D材料由于其优异的抗短沟道效应(SCE)能力,有望成为极短沟道长度场效应晶体管(FET)的理想沟道材料。石墨烯是最著名的2D材料,在没有附加技术的情况下没有带隙,这一特性是减少漏极泄漏的主要障碍。因此,低功耗FET需要具有有限带隙的2D材料,例如过渡金属二硫属化物(TMD,例如MoS 2 WSe 2)或磷烯。二硫化铪(HfS 2)是一种新型的TMD,尚未被研究作为沟道材料。我们专注于其平衡迁移率和带隙特性的潜力。Hf二硫族化合物比Mo或W硫族化合物具有更高的电子亲合势,有利于与其他二维材料形成低电阻接触和交错异质结。在这里,我们展示了第一个几层HfS 2 FET,具有稳定的电流饱和和超过10^4的高电流开/关比。

英文摘要:

2D materials are expected to be favorable channel materials for field-effect transistor (FET) with extremely short channel length because of their superior immunity to short-channel effects (SCE). Graphene, which is the most famous 2D material, has no bandgap without additional techniques and this property is major hindrance in reducing the drain leakage. Therefore, 2D materials with finite band gap, such as transition metal dichalcogenides (TMDs, e.g. MoS2 WSe2) or phosphorene, are required for the low power consumption FETs. Hafnium disulfide (HfS2) is a novel TMD, which has not been investigated as channel material. We focused on its potential for well-balanced mobility and bandgap properties. The higher electron affinity of Hf dichalcogenides compared with Mo or W chalcogenides facilitates the formation of low resistance contact and staggered heterojunction with other 2D materials. Here we demonstrate the first few layer HfS2 FET with robust current saturation and high current on/off ratio of more than 10^4.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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