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arXiv 1502.00411cond-mat.mtrl-scicond-mat.mes-hall
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金属表面石墨烯的扫描探针显微镜和光谱学研究

Scanning probe microscopy and spectroscopy of graphene on metals

Yuriy Dedkov, Elena Voloshina, Mikhail Fonin

摘要:

石墨烯是一种具有独特电子性质的二维材料,是表面科学方法应用的理想对象。其中,一系列扫描探针显微镜方法(STM,AFM,KPFM)和相应的光谱附加功能提供了有关石墨烯局部尺度(从内联图像到原子)的结构和电子性质的信息。本文综述了近年来这些显微/光谱方法在金属表面石墨烯(界面、类插层体系、石墨烯纳米带和量子点等)研究中的应用。结果表明,非常重要的信息,在石墨烯/金属界面的相互作用强度,以及有关修改的电子光谱的石墨烯在费米能级上可以在本地尺度上获得。这些结果与通过其他方法获得的结果相结合,并与最近的理论数据进行比较,证明了这种方法用于石墨烯基系统的研究的能力。

英文摘要:

Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from inline imagem to atoms). This review focuses on the recent applications of these microscopic/spectroscopic methods for the investigation of graphene on metals (interfaces, intercalation-like systems, graphene nanoribbons, and quantum dots, etc.). It is shown that very important information about interaction strength at the graphene/metal interfaces as well as about modification of the electronic spectrum of graphene at the Fermi level can be obtained on the local scale. The combination of these results with those obtained by other methods and comparison with recent theoretical data demonstrate the power of this approach for the investigation of the graphene-based systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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