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arXiv 1406.0683cond-mat.mtrl-sci
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掺氢硅的振动零点能

Vibrational zero point energy for H-doped Silicon

S. Zh. Karazhanov, M. Ganchenkova, E. S. Marstein

摘要:

大部分的研究解决在半导体系统中的氢参数的计算,如硅,进行在零温度T=0 K和不占振动零点能(ZPE)的贡献。然而,对于诸如氢(H)的轻质原子,该参数的量值可能是不可忽略的。本文旨在阐明在分析硅中氢的行为及其对硅电子性质的影响时,考虑零点振动的重要性。为此,我们估计ZPE的不同位置和电荷状态的H在Si中。我们发现,ZPE的主要贡献是来自沿Si-H键的振动,而从其他Si原子的贡献,除了直接Si-H键发挥没有作用。它表明,会计的ZPE减少氢的形成能约0.17 eV,这意味着在低温下忽略ZPE,可以低估氢的溶解度几个数量级。相反,ZPE对Si中H的电离能的影响可以忽略不计。这些结果对于用非弹性中子散射表征Si的振动特性以及理论估算Si中H的浓度具有重要意义。

英文摘要:

Most of the studies addressed to computations of hydrogen parameters in semiconductor systems, such as silicon, are performed at zero temperature T=0 K and do not account for contribution of vibrational zero point energy (ZPE). For light weight atoms such as hydrogen (H), however, magnitude of this parameter might be not negligible. This work is devoted to clarify the importance of accounting the zero-point vibrations when analyzing hydrogen behavior in silicon and its effect on silicon electronic properties. For this, we estimate the ZPE for different locations and charge states of H in Si. We show that the main contribution to the ZPE is coming from vibrations along the Si-H bonds whereas contributions from other Si atoms apart from the direct Si-H bonds play no role. It is demonstrated that accounting the ZPE reduces the hydrogen formation energy by ~0.17 eV meaning that neglecting ZPE at low temperatures one can underestimate hydrogen solubility by few orders of magnitude. In contrast, the effect of the ZPE on the ionization energy of H in Si is negligible. The results can have important implications for characterization of vibrational properties of Si by inelastic neutron scattering, as well as for theoretical estimations of H concentration in Si.

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