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arXiv 1303.0749cond-mat.mtrl-sci
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MoS2晶体中载流子动力学的瞬态吸收显微研究

Charge carrier dynamics in bulk MoS2 crystal studied by transient absorption microscopy

Nardeep Kumar, Jiaqi He, Dawei He, Yongsheng Wang, Hui Zhao

摘要:

我们报道了室温下块状二硫化钼晶体中载流子动力学的瞬态吸收显微镜研究。通过555 nm脉冲的带间吸收注入载流子,并通过测量时间延迟和空间扫描的660 nm脉冲的差分反射来探测。我们发现谷间转移时间约为0.35 ps,热载流子的能量弛豫时间约为50 ps,载流子寿命为180 ps。通过监测载流子的时空动力学,我们得到了热化电子的扩散系数为4.2 cm 2/s,对应于170 cm 2/Vs的迁移率。我们还观察到随时间变化的热载流子的扩散系数。

英文摘要:

We report a transient absorption microscopy study of charge carrier dynamics in bulk MoS2 crystals at room temperature. Charge carriers are injected by interband absorption of a 555-nm pulse, and probed by measuring differential reflection of a time-delayed and spatially scanned 660-nm pulse. We find an intervalley transfer time of about 0.35 ps, an energy relaxation time of hot carriers on the order of 50 ps, and a carrier lifetime of 180 ps. By monitoring the spatiotemporal dynamics of carriers, we obtained a diffusion coefficient of thermalized electrons of 4.2 cm2/s, corresponding to a mobility of 170 cm2/Vs. We also observed a time-varying diffusion coefficient of hot carriers.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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