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arXiv 1302.5404cond-mat.mes-hall
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Si中自旋输运的偏压依赖特性及其导带底的探测

Bias dependent features in spin transport as a probe of the conduction band minima in Si

S. Parui, K. G. Rana, T. Banerjee

摘要:

利用弹道电子磁显微镜(BEMM)的局部探测能力,在高织构Cu(100)/Si(100)肖特基界面上制备的Co/Au/NiFe自旋阀中观察到自旋输运的偏压依赖性的异常特征.这是由于应变的局部差异和肖特基界面处存在的失配位错,其增强了自旋翻转散射并加宽了透射电子的能量和角分布。累积地,这些使得传输的热电子能够探测Si中的不同导带最小值,从而在磁流中产生这种偏压依赖性特征。这项研究揭示了新的见解的自旋依赖性的间接带隙半导体Si的传输,并突出了独特的能力,BEMM在探测局部差异,在自旋输运在这样的纹理界面。

英文摘要:

Unusual features in the bias dependence of spin transport are observed in a Co/Au/NiFe spin valve fabricated on a highly textured Cu(100)/Si(100) Schottky interface, exploiting the local probing capabilities of a Ballistic electron magnetic microscope (BEMM). This arises due to local differences in the strain and the presence of misfit dislocations at the Schottky interface that enhances spin flip scattering and broadens the energy and angular distribution of the transmitted electrons. Cumulatively, these enable the transmitted hot electrons to probe the different conduction band minima in Si, giving rise to such bias dependent features in the magnetocurrent. This study reveals new insights into the spin dependence of transmission in an indirect band gap semiconductor as Si and highlights the unique capabilities of BEMM in probing local differences in spin transport across such textured interfaces.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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