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arXiv 1208.5577cond-mat.mtrl-scicond-mat.str-el
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外延EuTiO3薄膜的导电机制

Conduction mechanisms of epitaxial EuTiO3 thin films

R. Zhao, W. W. Li, L. Chen, Q. Q. Meng, J. Yang, H. Wang, Y. Q. Wang, R. J. Tang, H. Yang

摘要:

为了研究漏电流密度与电场特性的关系,采用脉冲激光沉积法在(001)SrTiO 3衬底上外延生长EuTiO 3薄膜,并在还原气氛中进行后退火。研究发现,导电机制与温度和电压极性密切相关。据确定,从50至150 K的主导传导机制是负偏压和正偏压下的空间电荷限制电流。从200到300 K,导电机制显示肖特基发射和Fowler-Nordheim隧穿行为的负和正偏压,分别。研究表明,Eu ~(3+)是EuTiO_3薄膜的漏电流源之一。

英文摘要:

To investigate leakage current density versus electric field characteristics, epitaxial EuTiO3 thin films were deposited on (001) SrTiO3 substrates by pulsed laser deposition and were post-annealed in a reducing atmosphere. This investigation found that conduction mechanisms are strongly related to temperature and voltage polarity. It was determined that from 50 to 150 K the dominant conduction mechanism was a space-charge-limited current under both negative and positive biases. From 200 to 300 K, the conduction mechanism shows Schottky emission and Fowler-Nordheim tunneling behaviors for the negative and positive biases, respectively. This work demonstrates that Eu3+ is one source of leakage current in EuTiO3 thin films.

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