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arXiv 1106.2186cond-mat.mes-hall
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静电对碳纳米管晶体管接触的影响

Electrostatic effects on contacts to carbon nanotube transistors

Aron W. Cummings, François Léonard

摘要:

我们使用数值模拟来研究静电对碳纳米管场效应晶体管的源极和漏极接触的影响。我们发现,在接触通道界面的纳米管上的未屏蔽的电荷会导致一个势垒,可以显着阻碍通过设备的运输。这种影响是最大的中间栅极电压和欧姆-肖特基交叉附近的接触,但可以减轻在栅极氧化层厚度的减少。这些结果有助于阐明接触几何形状在碳纳米管电子器件性能中的重要作用。

英文摘要:

We use numerical simulations to investigate the effect of electrostatics on the source and drain contacts of carbon nanotube field-effect transistors. We find that unscreened charge on the nanotube at the contact-channel interface leads to a potential barrier that can significantly hamper transport through the device. This effect is largest for intermediate gate voltages and for contacts near the ohmic-Schottky crossover, but can be mitigated with a reduction in the gate oxide thickness. These results help to elucidate the important role that contact geometry plays in the performance of carbon nanotube electronic devices.

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