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arXiv 0906.0904cond-mat.mes-hall
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用Kelvin力显微镜测定碳纳米管场效应晶体管的静电杠杆臂

Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin Force Microscopy

David Brunel, Dominique Deresmes, Thierry Melin

摘要:

我们利用开尔文力显微镜(KFM)研究了具有背栅结构的单壁碳纳米管场效应晶体管器件(CNTFFET)在室温下的静电特性。我们表明,KFM地图记录作为一个功能的设备背栅极化,使一个完整的现象学确定与KFM探针侧电容的平均效应,从而获得KFM测量与定量字符。的CNTFET的静电杠杆臂的值是从KFM测量确定的,并发现与基于库仑阻塞的传输测量的协议。

英文摘要:

We use Kelvin Force Microscopy (KFM) to study the electrostatic properties of single-walled Carbon Nanotube Field Effect Transistor devices (CNTFETs) with backgate geometry at room temperature. We show that KFM maps recorded as a function of the device backgate polarization enable a complete phenomenological determination of the averaging effects associated with the KFM probe side capacitances, and thus, to obtain KFM measurements with quantitative character. The value of the electrostatic lever arm of the CNTFET is determined from KFM measurements, and found in agreement with transport measurements based on Coulomb blockade.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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