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arXiv 1104.4170cond-mat.mes-hall
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STM尖端朝向微米尺寸样品的自导航

Self-navigation of STM tip toward a micron sized sample

Guohong Li, Adina Luican, Eva Y. Andrei

摘要:

我们展示了一个简单的电容为基础的方法,快速,有效地定位在绝缘基板上的扫描隧道显微镜(STM)微米尺寸的导电样品。通过使用边缘识别,该方法被设计为当STM尖端远离表面时定位和识别小特征,从而允许无碰撞搜索和导航。该方法可以在任何STM环境中实现,即使在低温和强磁场中,具有最小的或没有硬件修改。

英文摘要:

We demonstrate a simple capacitive based method to quickly and efficiently locate micron size conductive samples on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition the method is designed to locate and identify small features when the STM tip is far above the surface allowing for crash-free search and navigation. The method can be implemented in any STM environment even at low temperatures and in strong magnetic field, with minimal or no hardware modifications.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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