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arXiv 1008.0396cond-mat.mtrl-scicond-mat.mes-hall
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拓扑绝缘体Bi $_2$ Se $_3$纳米晶的制备与表征

Fabrication and Characterization of Topological Insulator Bi$_2$Se$_3$ Nanocrystals

S. Y. F. Zhao, C. Beekman, L. J. Sandilands, J. E. J. Bashucky, D. Kwok, N. Lee, A. D. LaForge, S. W. Cheong, K. S. Burch

摘要:

在最近发现的一类被称为拓扑绝缘体的材料中,强自旋-轨道耦合的存在导致体中的某些拓扑不变量与它们在真空中的值不同。在界面处的不变量的突然变化导致金属,时间反演不变的表面状态,其性质是有用的自旋电子学和量子计算中的应用。然而,一个关键的挑战是在纳米尺度上制造这些材料,使其适合于器件和探测表面。为此,我们通过机械剥离制备了拓扑绝缘体Bi $_2$ Se $_3$的2 nm厚的纳米晶体。对于薄于10 nm的晶体,我们观察到的拉曼光谱中的一个额外的模式的出现。出射模强度与其他结果一起提供了Bi $_2$ Se $_3$纳米晶体的生产和厚度表征的配方。

英文摘要:

In the recently discovered class of materials known as topological insulators, the presence of strong spin-orbit coupling causes certain topological invariants in the bulk to differ from their values in vacuum. The sudden change of invariants at the interface results in metallic, time reversal invariant surface states whose properties are useful for applications in spintronics and quantum computation. However, a key challenge is to fabricate these materials on the nanoscale appropriate for devices and probing the surface. To this end we have produced 2 nm thick nanocrystals of the topological insulator Bi$_2$Se$_3$ via mechanical exfoliation. For crystals thinner than 10 nm we observe the emergence of an additional mode in the Raman spectrum. The emergent mode intensity together with the other results presented here provide a recipe for production and thickness characterization of Bi$_2$Se$_3$ nanocrystals.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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