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arXiv 1005.4595cond-mat.mtrl-sci
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蓝宝石a面衬底上CoMnGe薄膜的结构、静态和动态磁性能

Structural, static and dynamic magnetic properties of CoMnGe thin films on a sapphire a-plane substrate

Mohamed Belmeguenai, Fatih Zighem, Thierry Chauveau, Damien Faurie, Yves Roussigné, Salim Mourad Chérif, Philippe Moch, Kurt Westerholt, Philippe Monod

摘要:

采用振动样品磁强计(VSM)和常规或微带线(MS)铁磁共振(FMR)研究了400°C下射频溅射法在蓝宝石单晶衬底上生长的不同厚度(13、34、55、83、100和200 nm)的CoMnGe薄膜的磁性。假设磁能密度显示出两重和四重的面内各向异性,并且在它们的主方向之间具有一些不对准,来描述它们的行为。对于所有的样品,四重各向异性的易轴是平行于衬底的c轴,而两重各向异性的易轴的方向不同,从样品到样品,似乎是强烈的生长条件的影响。它的方向最有可能是监测轻微的不可避免的角度的错切的Al2O3基板。与四重场的温度递减函数相反,二重面内各向异性场几乎与温度无关。最后,我们研究了所观察到的共振模式的线宽的频率依赖性,我们得出结论,一个典型的吉尔伯特阻尼常数为0.0065的55 nm厚的膜。

英文摘要:

Magnetic properties of CoMnGe thin films of different thicknesses (13, 34, 55, 83, 100 and 200 nm), grown by RF sputtering at 400°C on single crystal sapphire substrates, were studied using vibrating sample magnetometry (VSM) and conventional or micro-strip line (MS) ferromagnetic resonance (FMR). Their behavior is described assuming a magnetic energy density showing twofold and fourfold in-plane anisotropies with some misalignment between their principal directions. For all the samples, the easy axis of the fourfold anisotropy is parallel to the c-axis of the substrate while the direction of the twofold anisotropy easy axis varies from sample to sample and seems to be strongly influenced by the growth conditions. Its direction is most probably monitored by the slight unavoidable angle of miscut the Al2O3 substrate. The twofold in-plane anisotropy field is almost temperature independent, in contrast with the fourfold field which is a decreasing function of the temperature. Finally, we study the frequency dependence of the observed line-width of the resonant mode and we conclude to a typical Gilbert damping constant of 0.0065 for the 55-nm-thick film.

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