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arXiv 1004.3909cond-mat.mes-hall
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metal/YBa2Cu3O7-x界面结电阻开关效应的研究

Studies of resistance switching effects in metal/YBa2Cu3O7-x interface junctions

A. Plecenik, M. Tomasek, T. Plecenik, M. Truchly, J. Noskovic, M. Zahoran, T. Roch, M. Belogolovskii, M. Spankova, S. Chromik, P. Kus

摘要:

在4.2 ~ 300 K温度范围内测量了外延生长的c轴取向YBa 2 Cu 3 O 7-x薄膜微桥与Ag对电极形成的平面结的电流-电压特性。的滞后行为有关的结电阻从高阻态切换到低阻态,反之亦然,观察和分析的最大电流偏置和温度依赖性。利用扫描隧道显微镜在亚微米尺度的YBa_2Cu_3 O_(7-x)薄膜- PtIr点接触结上观察到了相同的效应。在扩散模型中讨论了这些现象,描述了在外加电场下YBa 2Cu 3 O 7-x薄膜中结界面纳米尺度附近的氧空位漂移。

英文摘要:

Current-voltage characteristics of planar junctions formed by an epitaxial c-axis oriented YBa2Cu3O7-x thin film micro-bridge and Ag counter-electrode were measured in the temperature range from 4.2 K to 300 K. A hysteretic behavior related to switching of the junction resistance from a high-resistive to a low-resistive state and vice-versa was observed and analyzed in terms of the maximal current bias and temperature dependence. The same effects were observed on a sub-micrometer scale YBa2Cu3O7-x thin film - PtIr point contact junctions using Scanning Tunneling Microscope. These phenomena are discussed within a diffusion model, describing an oxygen vacancy drift in YBa2Cu3O7-x films in the nano-scale vicinity of the junction interface under applied electrical fields.

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