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arXiv 0908.1329cond-mat.mes-hall
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双层石墨烯中的带电杂质散射

Charged impurity scattering in bilayer graphene

Shudong Xiao, Jian-Hao Chen, Shaffique Adam, Ellen D. Williams, Michael S. Fuhrer

摘要:

研究了低温超高真空下沉积钾时,杂质散射对双层石墨烯(BLG)中载流子输运的影响。带电杂质散射产生的电导率在载流子密度上呈超线性,在2-4 x 10^12 cm^-2的载流子密度测量范围内,其大小与单层石墨烯相似。在添加浓度为n_imp的带电杂质时,最小电导率Sigma_min与n_imp^-1/2成比例地降低,而电子和空穴熔池载流子密度与n_imp ^1/2成比例地增加。这些结果的有意沉积钾的BLG与带电杂质散射的理论预测吻合得很好。然而,我们的研究结果也表明,带电杂质散射单独不能解释所观察到的原始BLG钾掺杂前的SiO2上的输运性质。

英文摘要:

We have examined the impact of charged impurity scattering on charge carrier transport in bilayer graphene (BLG) by deposition of potassium in ultra-high vacuum at low temperature. Charged impurity scattering gives a conductivity which is supra-linear in carrier density, with a magnitude similar to single-layer graphene for the measured range of carrier densities of 2-4 x 10^12 cm^-2. Upon addition of charged impurities of concentration n_imp, the minimum conductivity Sigma_min decreases proportional to n_imp^-1/2, while the electron and hole puddle carrier density increases proportional to n_imp^1/2. These results for the intentional deposition of potassium on BLG are in good agreement with theoretical predictions for charged impurity scattering. However, our results also suggest that charged impurity scattering alone cannot explain the observed transport properties of pristine BLG on SiO2 before potassium doping.

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