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arXiv 0903.3740cond-mat.stat-mechquant-ph
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局域和扩展界面缺陷的纠缠熵

Entanglement entropy with localized and extended interface defects

Ferenc Iglói, Zsolt Szatmári, Yu-Cheng Lin

摘要:

的量子伊辛链的长度,L,这是分为两个部分的本地化或扩展的缺陷被认为是在临界点处的界面磁化的缩放是非普遍的。我们测量的纠缠熵之间的两个半系统的平衡,以及淬火后,当在界面上的相互作用改变时间t>0。对于局域缺陷,熵随log(L)或log(t)的增加涉及相同的有效中心荷,其是缺陷强度的连续函数。相反,对于扩展的缺陷,平衡熵是饱和的,但非平衡熵具有对数时间依赖性,其前因子取决于缺陷的强度。

英文摘要:

The quantum Ising chain of length, L, which is separated into two parts by localized or extended defects is considered at the critical point where scaling of the interface magnetization is non-universal. We measure the entanglement entropy between the two halves of the system in equilibrium, as well as after a quench, when the interaction at the interface is changed for time t>0. For the localized defect the increase of the entropy with log(L) or with log(t) involves the same effective central charge, which is a continuous function of the strength of the defect. On the contrary for the extended defect the equilibrium entropy is saturated, but the non-equilibrium entropy has a logarithmic time-dependence the prefactor of which depends on the strength of the defect.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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