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arXiv 1005.2144cond-mat.stat-mech
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含界面缺陷的费米子纠缠问题的解

Solution of the fermionic entanglement problem with interface defects

Viktor Eisler, Ingo Peschel

摘要:

研究了由界面缺陷分开的两半临界横向伊辛链的基态纠缠。从与含缺陷线的二维伊辛模型的关系出发,我们得到了连续变化的有效中心荷的精确表达式。这个结果也适用于其他的费米子链。

英文摘要:

We study the ground-state entanglement of two halves of a critical transverse Ising chain, separated by an interface defect. From the relation to a two-dimensional Ising model with a defect line we obtain an exact expression for the continuously varying effective central charge. The result is relevant also for other fermionic chains.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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