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arXiv 0810.2692cond-mat.mtrl-sci
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半绝缘GaAs中单个类氢杂质的微观研究

The microscopic study of a single hydrogen-like impurity in semi-insulating GaAs

D. G. Eshchenko, V. G. Storchak, S. P. Cottrell, E. Morenzoni

摘要:

用μ子自旋共振方法研究了电场中高能μ子注入半绝缘GaAs中形成的类氢中心的电荷动力学。结果表明,深空穴陷阱在GaAs的补偿机制中起着重要作用。电场增强的μ子径迹诱导的热载流子对深电子和空穴陷阱的中和导致非平衡载流子寿命的增加。因此,四面体As位上的μ素($μ^+ + e^-$)中心可以捕获径迹的空穴,因此表现得像供体。

英文摘要:

The charge dynamics of hydrogen-like centers formed by the implantation of energetic (4 MeV) muons in semi-insulating GaAs have been studied by muon spin resonance in electric fields. The results point to the significant role of deep hole traps in the compensation mechanism of GaAs. Electric-field-enhanced neutralization of deep electron and hole traps by muon-track-induced hot carriers results to an increase of the non-equilibrium carrier life-times. As a consequence, the muonium ($μ^+ + e^-$) center at the tetrahedral As site can capture the track's holes and therefore behaves like a donor.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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