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arXiv 0809.4905cond-mat.mtrl-sci
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杂化泛函计算O $_{2}$分子在硅氧化过程中的电荷态

Charge state of the O$_{2}$ molecule during silicon oxidation through hybrid functional calculations

Audrius Alkauskas, Peter Broqvist, Alfredo Pasquarello

摘要:

通过杂化泛函计算研究了扩散态O $_2$分子在硅氧化过程中的电荷态。我们计算了O $_2$在体SiO $_2$中的电荷跃迁能级,并使用理论能带偏移来对准这些能级相对于Si能带边缘。为了克服半局域密度泛函的带隙问题,我们采用混合泛函与预定义的和经验调整的混合系数。我们发现,在体硅$_2$的电荷跃迁能级$ε^{0/-}$发生在$\sim$ 1.1 eV以上的硅导带边,这意味着O $_2$分子扩散通过氧化物中的中性电荷状态。虽然界面效应一致降低电荷跃迁水平,我们的估计表明,中性电荷状态持续到硅氧化。

英文摘要:

We study the charge state of the diffusing O$_2$ molecule during silicon oxidation through hybrid functional calculations. We calculate charge transition levels of O$_2$ in bulk SiO$_2$ and use theoretical band offsets to align these levels with respect to the Si band edges. To overcome the band-gap problem of semilocal density fuctionals, we employ hybrid functionals with both predefined and empirically adjusted mixing coefficients. We find that the charge transition level $ε^{0/-}$ in bulk SiO$_2$ occurs at $\sim$1.1 eV above the silicon conduction band edge, implying that the O$_2$ molecule diffuses through the oxide in the neutral charge state. While interfacial effects concur to lower the charge transition level, our estimates suggest that the neutral charge state persists until silicon oxidation.

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