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arXiv quant-ph/0409023quant-ph
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Testing a Quantum Computer

Jacob D. Biamonte, Marek A. Perkowski

英文摘要:

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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