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原子芯片中的热自旋翻转

Thermal spin flips in atom chips

Per-Kristian Rekdal, Stefan Scheel, Peter L. Knight, E. A. Hinds

摘要:

我们导出了耦合到磁场中的中性二能级超冷原子的自发自旋翻转率和热自旋翻转率。我们将这个理论应用到一个原子附近的一个2层圆柱形吸收介质体周围的一个无界均匀介质。在这种特殊的几何形状的自发和热自旋翻转率的解析表达式。然后用数值计算相应的寿命。我们将这些理论寿命与Jones等人[M.P.A. Jones,C.J. Vale,D. Sahagun,B.V. Hall和E.A. Hinds,Phys. Rev. Lett. { \bf 91},080401(2003)]。我们调查的寿命取决于材料(集肤深度)的圆柱体。我们还显示了如何缩放的尺寸的圆柱体的影响寿命时,(i)从电线到原子的距离是固定的,(ii)当从电线到原子的距离缩放。

英文摘要:

We derive the spontaneous and thermal spin-flip rates for a neutral two-level ultra-cold atom that is coupled to a magnetic field. We apply this theory to an atom in the vicinity of a 2-layer cylindrical absorbing dielectric body surrounded by an unbounded homogeneous medium. An analytical expression is obtained for the spontaneous and thermal spin-flip rate in this particular geometry. The corresponding lifetime is then computed numerically. We compare these theoretical lifetimes to those measured by Jones et al. [M.P.A. Jones, C.J. Vale, D. Sahagun, B.V. Hall, and E.A. Hinds, Phys. Rev. Lett. {\bf 91}, 080401 (2003)]. We investigate how the lifetime depends on the materials (skin depths) of the cylindrical body. We also show how scaling of the dimensions of the cylindrical body affects the lifetime when (i) the distance from the wire to the atom is fixed and (ii) when the distance from the wire to the atom is scaled.

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