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arXiv quant-ph/0702132quant-ph
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原子微芯片单原子探测器的标定

Calibration of a single atom detector for atomic micro chips

A. Stibor, S. Kraft, T. Campey, D. Komma, A. Günther, J. Fortágh, C. J. Vale, H. Rubinsztein-Dunlop, C. Zimmermann

摘要:

我们实验研究了一种探测被磁囚禁在原子芯片上的单原子的方案。该检测器基于原子的光致电离和随后对所产生的离子的检测。我们描述的离子检测器的特性,强调其校准通过相关的离子与同时产生的电子。测量的探测效率为47.8%(± 2.6%),这对于单原子探测是有用的,并且接近允许具有亚泊松不确定性的原子计数的极限。

英文摘要:

We experimentally investigate a scheme for detecting single atoms magnetically trapped on an atom chip. The detector is based on the photoionization of atoms and the subsequent detection of the generated ions. We describe the characterization of the ion detector with emphasis on its calibration via the correlation of ions with simultaneously generated electrons. A detection efficiency of 47.8% (+-2.6%) is measured, which is useful for single atom detection, and close to the limit allowing atom counting with sub-Poissonian uncertainty.

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