An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, J. C. H. Spence
备注：
9 pages, 4 figures
发表信息：
Journ. of El. Spect. & Rel. Phen. 170, pp 4-12 (2009).
X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available x-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a lifescience sample by XDM with a given resolution. We conclude that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered by reports in the literature. The tentative conclusion of this study is that XDM should be able to image frozen-hydrated protein samples at a resolution of about 10 nm with "Rose-criterion" image quality.
Light-field microscopy represents a promising solution for microscopic volumetric imaging, thanks to its capability to encode information on multiple planes in a single acquisition. This is achieved through its peculiar simultaneous capture of information on light spatial distribution and propagation direction. However, state-of-the-art light-field microscopes suffer from a detrimental loss of spatial resolution compared to standard microscopes. We propose and experimentally demonstrate a light-field microscopy architecture based on light intensity correlation, in which resolution is limited o…
Electronic Damage Suppression in X-ray Diffraction with Attosecond X-ray Pulses
European XFEL（欧洲自由电子激光）；Institute of Nuclear Physics, Polish Academy of Sciences（波兰科学院核物理研究所）；Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY（德国电子同步加速器中心CFEL自由电子激光科学中心）；Department of Advanced Materials Science, The University of Tokyo（东京大学先进材料科学系）；RIKEN SPring-8 Center（理化学研究所SPring-8中心）；Institute for Experimental Physics/CFEL, University of Hamburg（汉堡大学实验物理研究所/CFEL）
This paper proposes a non-computational method of counteracting the effect of image degradation introduced by the diffraction phenomenon in lensless microscopy. All the optical images (whether focused by lenses or not) are diffraction patterns, which preserve the visual information upto a certain extent determined by the size of the point spread functions, like airy disks in some cases. A highly diverging beam can be exploited to reduce the spatial extent of these point spread functions relatively in the transformed projective space, which can help us in the spatial unmixing of the visual info…
Speckle patterns have been widely used in imaging techniques such as ghost imaging, dynamic speckle illumination microscopy, structured illumination microscopy, and photoacoustic fluctuation imaging. Recent advances in the ability to control the statistical properties of speckles has enabled the customization of speckle patterns for specific imaging applications. In this work, we design and create special speckle patterns for parallelized nonlinear pattern-illumination microscopy based on fluorescence photoswitching. We present a proof-of-principle experimental demonstration where we obtain a …
Acoustic-resolution optoacoustic microscopy (AR-OAM) retrieves anatomical and functional contrast from living tissues at depths not reachable with optical microscopy. The imaging performance of AR-OAM has been advanced with image reconstruction algorithms providing high lateral resolution ultimately limited by acoustic diffraction. In this work, we suggest a new model-based framework efficiently exploiting scanning symmetries for high-resolution reconstruction of AR-OAM images. The model accurately accounts for the spatial impulse response and large detection bandwidth of a spherical polyvinyl…
In this theoretical study, the author firstly discusses the wave interference of Bragg diffraction inside 3D crystal, followed by quantum mechanical interpretation on the diffraction process, and proves that the interference fringe between Bragg diffraction and the incident beam is identical to the lattice plane. By introducing the beam expander concept, we may explain the image projection mechanism of Bragg diffractions propagating through TEM: Transmission Electron Microscope. In practice, we will take projection images at zone axes, because of its symmetric high-density diffractions associa…
Modern optical microscopy methods have been advanced to provide super resolution at high imaging speed, but not chirality discriminative. We recently proposed chiral structured-illumination microscopy (SIM) method to image chiral fluorescent domains at sub-wavelength resolution. Chiral SIM is suitable for imaging chiral domains at sub-wavelength resolution but loses the high spatial frequency of the achiral ones. In order to obtain the full picture of all fluorescent domains at sub-wavelength resolution, we propose an advanced version of chiral SIM, termed double SIM, which enables simultaneou…
Imaging artefacts in scattering-type scanning near field optical microscopy arising from optical diffraction effects and contrast-active sub-surface features
Deep Learning Enables Large Depth-of-Field Images for Sub-Diffraction-Limit Scanning Superlens Microscopy
City University of Hong Kong（香港城市大学）；State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences（中国科学院沈阳自动化研究所机器人学国家重点实验室）；Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences（中国科学院机器人与智能制造创新研究院）；The University of Hong Kong（香港大学）；City University of Hong Kong Shenzhen Research Institute (CityUSRI)（香港城市大学深圳研究院）
Super-resolution imaging techniques enable nanoscale microscopy in fields such as physics, biology, and chemistry. However, many super-resolution techniques require specialized optical components, such as a helical-phase mask. We present a novel technique, Super-resolution Airy disk Microscopy (SAM) that can be used in a standard confocal microscope without any specialized optics. We demonstrate this technique, in combination with ground state depletion, to image and control nitrogen-vacancy (NV) centers in bulk diamond below the diffraction limit. A greater than 14-fold improvement in resolut…
Structured illumination microscopy (SIM) provides images of fluorescent objects at an enhanced resolution greater than that of conventional epifluorescence wide-field microscopy. Initially demonstrated in 1999 to enhance the lateral resolution two-fold, it has since been extended to enhance axial resolution two-fold (2008), applied to live-cell imaging (2009) and combined with myriad other techniques, including interferometric detection (2008), confocal microscopy (2010) and light sheet illumination (2012). Despite these impressive developments, SIM remains, perhaps, the most poorly understood…
The emergence of far-field super-resolution microscopy has rejuvenated the possibility for nanoscale imaging. Approaches to far-field super-resolution that utilize point scanning often depends on spatially reducing the size of the focused spot. However, the focused spot always achieves high resolution at the expense of extremely low light efficiency for the probing mainlobe and high-intensity sidelobes, which limits the applications in nanoscale imaging and might cause misinterpretation of samples. Here we report a sharp probing spot with the diffraction efficiency of 3.76% at the resolution o…
One of the main characteristics of optical imaging systems is the spatial resolution, which is restricted by the diffraction limit to approximately half the wavelength of the incident light. Along with the recently developed classical super-resolution techniques, which aim at breaking the diffraction limit in classical systems, there is a class of quantum super-resolution techniques which leverage the non-classical nature of the optical signals radiated by quantum emitters, the so-called antibunching super-resolution microscopy. This approach can ensure a factor of $\sqrt{n}$ improvement in th…
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a p…
