利用未知散斑照明的落射荧光显微镜像差校正
Aberration correction in epi-fluorescence microscopy using unknown speckle illumination
AI总结：
本文提出一种利用未知散斑照明与匹配重建算法的计算光学方法，通过移动散斑图案采集数据，同时恢复高分辨率图像、点扩散函数、散斑图案和位移，以校正像差并达到或超过衍射极限分辨率。
摘要：
当样本存在像差或感兴趣区域位于不均匀介质深处时，落射荧光显微镜中的衍射受限成像仍然是一个挑战。自适应光学是一种有吸引力的解决方案，但视场有限且需要相对复杂的系统。另外，多年来已开发出重建算法来校正像差。不幸的是，纯后处理技术往往是不适定的，并且只能提供图像质量的增量改进。在这里，我们报告了一种计算光学方法，利用未知散斑照明和匹配的重建算法来校正像差并达到或超过衍射受限分辨率。数据采集通过相对于荧光物体移动未知散斑图案来进行。该方法同时恢复高分辨率图像、包含像差的系统点扩散函数、散斑照明图案和位移位置。
英文摘要：
Diffraction-limited imaging in epi-fluorescence microscopy remains a challenge when sample aberrations are present or when the region of interest rests deep within an inhomogeneous medium. Adaptive optics is an attractive solution albeit with limited field of view and requiring relatively complicated systems. Alternatively, reconstruction algorithms have been developed over the years to correct for aberrations. Unfortunately, purely postprocessing techniques tend to be ill-posed and provide only incremental improvements in image quality. Here, we report a computational optical approach using unknown speckle illumination and matched reconstruction algorithm to correct for aberrations and reach or surpass diffraction limited resolution. The data acquisition is performed by shifting an unknown speckle pattern with respect to the fluorescent object. The method recovers simultaneously a high-resolution image, the point spread function of the system that contains the aberrations, the speckle illumination pattern, and the shift positions.
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