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arXiv 0908.1678physics.optics
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受激发射损耗显微术的噪声限制分辨率

The noise-limited-resolution for stimulated emission depletion microscopy

Chris J. Lee, Klaus J. Boller

摘要:

随着显微术的最新发展,例如受激发射耗尽(STED)显微术,分辨率优于衍射极限的远场成像现在是商业上可用的技术。在这里,我们表明,在扩散制度的特殊情况下,STED成像的噪声限制的分辨率是独立的荧光标记的饱和强度。热运动限制了信号积分时间,对于给定的激发态寿命,这限制了可用于检测的光子总数。

英文摘要:

With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.

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