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arXiv 2601.08088cond-mat.mes-hallquant-ph
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Si/SiGe双量子点器件中的多级电荷波动

Multi-level charge fluctuations in a Si/SiGe double quantum dot device

Sandia National Laboratories(桑迪亚国家实验室);University of Rochester(罗切斯特大学)

Dylan Albrecht, Feiyang Ye, N. Tobias Jacobson, John M. Nichol

AI总结:

研究Si/SiGe双量子点器件中多级电荷波动的特性及其对器件性能的影响,通过模型比较确定最佳波动器模型并估计门电压灵敏度。

摘要:

在半导体量子点器件中常规观察到的离散电荷波动可能显著贡献于器件漂移和由于量子比特误校准导致的误差。理解这些离散电荷波动的性质和起源可能为材料改进或减轻半导体量子点器件中的电荷噪声提供见解。在本工作中,我们测量了Si/SiGe双量子点器件在不同器件工作电压和温度范围内的多级电荷波动。为了表征底层波动自由度的参数依赖性动态,我们对测量的噪声时间序列进行了详细分析。我们通过算法辅助的漂移检测和变化点检测来去除数据中的慢波动成分,作为预处理步骤。我们对不同n级波动器(nLF)因子隐马尔可夫模型(FHMMs)的后处理时间序列进行了模型比较,发现尽管在大多数扫描值中独立成对的2LF模型会被优先选择,但在电压空间的特定区域,4LF模型优于其他模型,表明两个波动器之间存在条件率依赖性。通过跟踪波动器转换率、偏置和权重在不同器件配置中的变化,我们估计了门电压和电导灵敏度。特别是,我们拟合了一个现象学的、详细平衡模型到提取的独立2LFs速率数据,得到杠杆臂估计值在-2 μeV/mV到4 μeV/mV之间,分别在两个2LFs和附近的门电极之间。我们预计这些表征结果可能有助于后续的电荷波动器的空间三角测量。

英文摘要:

Discrete charge fluctuations, routinely observed in semiconductor quantum dot devices, may contribute significantly to device drift and errors resulting from qubit miscalibration. Understanding the nature and origins of these discrete charge fluctuations may provide insights into material improvements or means of mitigating charge noise in semiconductor quantum dot devices. In this work, we measure multi-level charge fluctuations present in a Si/SiGe double quantum dot device over a range of device operating voltages and temperatures. To characterize the parameter-dependent dynamics of the underlying fluctuating degrees of freedom, we perform a detailed analysis of the measured noise timeseries. We perform algorithmically assisted drift detection and change point detection to detrend the data and remove a slow fluctuator component, as a preprocessing step. We perform model comparison on the post-processed time series between different $n$-level fluctuator ($n$LF) factorial hidden Markov models (FHMMs), finding that although at most sweep values the independent pair of 2LFs model would be preferred, in a particular region of voltage space the 4LF model outperforms the other models, indicating a conditional rate dependence between the two fluctuators. By tracking fluctuator transition rates, biases, and weights over a range of different device configurations, we estimate gate voltage and conductivity sensitivity. In particular, we fit a phenomenological, detailed balance model to the extracted independent 2LFs rate data, yielding lever arm estimates in the range of $-2 μ$eV/mV up to $4 μ$eV/mV between the two 2LFs and nearby gate electrodes. We expect that these characterization results may aid in subsequent spatial triangulation of the charge fluctuators.

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