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arXiv 1010.0972cond-mat.mes-hall
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Si/SiGe少电子量子点的单次测量和隧道速率谱

Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

Madhu Thalakulam, C. B. Simmons, B. J. Van Bael, B. M. Rosemeyer, D. E. Savage, M. G. Lagally, Mark Friesen, S. N. Coppersmith, M. A. Eriksson

摘要:

研究了Si/SiGe异质结构中量子点中少量电子激发态的隧穿速率和能量。隧道速率加载和卸载电子被发现是强烈的能量依赖性,它们之间的不同激发态显着变化。我们表明,这种现象使电荷传感测量的平均电子占据,是类似于库仑钻石。激发态能量可以直接从图中读取,我们开发了一个速率模型,使不同的电子隧道速率的相对大小的定量理解。

英文摘要:

We investigate the tunnel rates and energies of excited states of small numbers of electrons in a quantum dot fabricated in a Si/SiGe heterostructure. Tunnel rates for loading and unloading electrons are found to be strongly energy dependent, and they vary significantly between different excited states. We show that this phenomenon enables charge sensing measurements of the average electron occupation that are analogous to Coulomb diamonds. Excited-state energies can be read directly from the plot, and we develop a rate model that enables a quantitative understanding of the relative sizes of different electron tunnel rates.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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