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arXiv 1105.4941cond-mat.mes-hall
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SiGe双栅隧道场效应晶体管的器件改进和电路性能评价

Device Improvement and Circuit Performance Evaluation of complete SiGe Double Gate Tunnel FETs

Rahul Mishra, Bahniman Ghosh

摘要:

在最近的一部分,广泛的模拟工作已经做了TFFLOW。然而,这仅限于器械性能分析。电路性能的评估是一个很少涉及的话题。这是由于商业模拟器中没有紧凑型隧道FET模型。本文首次对隧道场效应晶体管进行了电路分析,并在基本数字电路上进行了测试。我们使用Orcad中的模型编辑器生成TFET模型。在Pspice电路设计中使用这些模型进行了大量的电路仿真。本文从反相器、与门、或非门和环形振荡器的功率和延迟等方面对扩展沟道双栅TFET的性能进行了评价。在此之前,我们对双栅扩展沟道TFT进行了器件分析,扩展沟道在SOI TFT上进行了尝试,我们首次在双栅Si_(1-x)Ge_x TFT上进行了尝试。我们甚至考虑了引入Si层的效果。比较了不同Ge摩尔分数下器件的性能,并与MOSFET器件进行了比较

英文摘要:

In recent part extensive simulation work has already been done on TFETs. However this is limited to device performance analysis. Evaluation of circuit performance is a topic that is very little touched. This is due to the non availability of compact models of Tunnel FETs in the commercial simulator. In our paper for the first time we perform the circuit analysis of tunnel FETs (extended channel TFETs), we test them over basic digital circuit. We generate the TFET models by using the model editor in Orcad. Extensive circuit simulation is then performed by using these models in the Pspice circuit design. Performance of extended channel double gate TFET is evaluated on the grounds of power and delay in inverter, nand gate, nor gate and ring oscillator. Before that we perform device analysis of double gate extended channel TFETs, extended channel has been tried before on SOI TFETs we try it for the first time on double gate Si1-xGex TFETs. We even look at the effect of introducing Si layer. The performance of this device is compared for different Ge mole fraction and also with MOSFETs

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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