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arXiv 2404.02404cond-mat.mtrl-sciphysics.app-ph
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源-基底距离对硫化锌薄膜结构、光电和热电性能的影响

Effect of the Source toSubstrate Distance on Structural, Optoelectronic, and Thermoelectric Properties of Zinc Sulfide Thin Films

Asad Ur Rehman Khan, Muhammad Ramzan, Muhammad Faisal Iqbal, Muhammad Hafeez, Mohammed M. Fadhali, Hamoud H. Somaily, Muhammad Javid, Muhammad Waqas Mukhtar, Muhammad Farooq Saleem

AI总结:

本研究在PVTC系统中调节SSD距离制备ZnS薄膜,考察其对薄膜结构及光学、电学和热电性能的影响,并确认薄膜形成具有111择优取向的闪锌矿立方结构。

摘要:

通过改变物理气相热涂覆PVTC系统中的源-基底SSD距离,获得了结构、光学、电学和热电性能可变的硫化锌ZnS薄膜。这些薄膜结晶为具有111择优取向的闪锌矿立方结构。

英文摘要:

Zinc sulfide ZnS thin films with variable structural, optical, electrical, and thermoelectric properties were obtained by changing the source to substrate SSD distance in the physical vaporthermal coating PVTC system. The films crystallized into a zinc blede cubic structure with 111 preferred orientation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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