arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2204.06129cond-mat.mtrl-sciphysics.chem-ph
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$α$ $_2$ O $_3$瞬态XUV测量中激发态和极化子效应的从头计算

Ab Initio Prediction of Excited State and Polaron Effects in Transient XUV Measurements of $α$-Fe$_2$O$_3$

Isabel M. Klein, Hanzhe Liu, Danika Nimlos, Alex Krotz, Scott K. Cushing

摘要:

瞬态X射线和极紫外(XUV)光谱已成为研究光激发动力学的宝贵工具,由于它们对载流子占据和局部化学或结构变化的敏感性。$α$ -Fe $_2$ O $_3$是利用瞬态XUV光谱研究最多的材料之一,因为它具有丰富的光激发动力学,包括小极化子的形成。在$α$ $_2$ O $_3$中载流子和极化子效应的解释目前是使用半经验方法完成的,该方法不能转移到大多数材料。在这里,从头算,贝特-萨尔彼得方程(BSE)的方法,可以将光激发态效应的任意材料系统的开发。通过计算$α$ -Fe $_2$ O $_3$的基态、光激发态和极化子态的XUV吸收光谱证明了这种方法的准确性。此外,理论方法允许的核心价激子和不同的组件的X射线跃迁哈密顿到能带结构的投影,提供新的见解旧的测量。从这些信息中,可以建立关于瞬态XUV光谱的起源和性质的物理直觉。提取电子和空穴能量的路线,甚至显示出可能的高度角动量分裂XUV峰。这种方法很容易推广到K,L,M和N边缘,提供了一个通用的方法来分析瞬态X射线吸收或反射数据。

英文摘要:

Transient X-ray and extreme ultraviolet (XUV) spectroscopies have become invaluable tools for studying photoexcited dynamics due to their sensitivity to carrier occupations and local chemical or structural changes. One of the most studied mate-rials using transient XUV spectroscopy is $α$-Fe$_2$O$_3$ because of its rich photoexcited dynamics, including small polaron formation. The interpretation of carrier and polaron effects in $α$-Fe$_2$O$_3$ is currently done using a semi-empirical method that is not transferrable to most materials. Here, an ab initio, Bethe-Salpeter equation (BSE) approach is developed that can incorporate photoexcited state effects for arbitrary materials systems. The accuracy of this approach is proven by calculating the XUV absorption spectra for the ground, photoexcited, and polaron states of $α$-Fe$_2$O$_3$. Furthermore, the theoretical approach allows for the projection of the core-valence excitons and different components of the X-ray transition Hamiltonian onto the band structure, providing new insights into old measurements. From this information, a physical intuition about the origins and nature of the transient XUV spectra can be built. A route to extracting electron and hole energies is even shown possible for highly angular momentum split XUV peaks. This method is easily generalized to K, L, M, and N edges to provide a general approach for analyzing transient X-ray absorption or reflection data.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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