In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate models of the DFXM contrast mechanism and detector measurement noise, along with initial position estimates, into a statistical model coupling DFXM images with the dislocation position of interest. We motivate several position estimation and uncertainty quantification algorithms based on this model. We then demonstrate the accuracy of our primary estimation algorithm on synthetic realistic DFXM images of edge dislocations in single crystal aluminum. We conclude with a discussion of our methods' impact on future dislocation studies and possible future research avenues.
Unexpected Planar Dislocation Boundary Formation in FCC Metals Captured by Dark-Field X-ray Microscopy and Continuum Dislocation Dynamics
Technical University of Denmark（丹麦技术大学）；Purdue University（普渡大学）；European Synchrotron Radiation Facility (ESRF)（欧洲同步辐射装置）；Karlsruhe Institute of Technology (KIT)（卡尔斯鲁厄理工学院）
High-throughput, Non-Destructive, Three-Dimensional Imaging of GaN Threading Dislocations with in-Plane Burgers Vector Component via Phase-Contrast Microscopy
Emerging hierarchical dislocation structures: Insights from scanning electron microscopy-electron backscatter diffraction in situ tensile testing and multifractal analysis
Diamond crystal with Y-defects: spectroscopy and transmission electron microscopy
Frumkin Institute of physical chemistry and electrochemistry RAS（俄罗斯科学院弗鲁姆金物理化学与电化学研究所）；Saint Petersburg mining university（圣彼得堡矿业大学）；Shubnikov Institute of Crystallography, Kurchatov Complex of Crystallography and Photonics, National Research Centre "Kurchatov Institute,"（库尔恰托夫国家研究中心库尔恰托夫晶体学与光子学综合体内的舒布尼科夫晶体学研究所）；Moscow Institute of Physics and Technology（莫斯科物理技术学院）；Zavaritsky Institute of Geology and Geochemistry UB RAS（俄罗斯联邦科学院乌拉尔分支扎瓦茨基地质与地球化学研究所）
Spatially resolved elastic strain and lattice rotation at threading dislocations in HgCdTe/CdZnTe epilayers by dark-field X-ray microscopy
European Synchrotron Radiation Facility（欧洲同步辐射装置）；Université Grenoble Alpes, CEA, LETI（格勒诺布尔阿尔卑斯大学，CEA，LETI）；Karlsruhe Institute of Technology（卡尔斯鲁厄理工学院）
Quantitative strain-field measurement of 1:1 B-site cation ordered domains and antiphase boundaries in Pb(Sc1/2Ta1/2)O3 ceramics by high-resolution transmission electron microscopy
Automated Burgers Vector Identification for Individual Dislocations in Bulk Crystals
European Synchrotron Radiation Facility（欧洲同步辐射装置）；Univ. Grenoble Alpes（格勒诺布尔阿尔卑斯大学）；Department of Physics, Technical University of Denmark（丹麦技术大学物理系）；Department of Mechanical Engineering, Technical University of Denmark（丹麦技术大学机械工程系）
Nanoscale mapping of the full strain tensor, rotation and composition in partially relaxed In$_x$Ga$_{1-x}$N layers by scanning X-ray diffraction microscopy
