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arXiv 2107.03412astro-ph.IMphysics.ins-det
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Athena X-IFU检测和读出链测试平台

A test platform for the detection and readout chain for the Athena X-IFU

Gabriele Betancourt-Martinez, François Pajot, Sophie Beaumont, Gilles Roudil, Joseph Adams, Hiroki Akamatsu, Simon Bandler, Bernard Bertrand, Marcel Bruijn, Flo… 展开作者

Gabriele Betancourt-Martinez, François Pajot, Sophie Beaumont, Gilles Roudil, Joseph Adams, Hiroki Akamatsu, Simon Bandler, Bernard Bertrand, Marcel Bruijn, Florent Castellani, Edoardo Cucchetti, William Doriese, Michel Dupieux, Hervé Geoffray, Luciano Gottardi, Brian Jackson, Jan van der Kuur, Mikko Kiviranta, Antoine Miniussi, Phillipe Peille, Kevin Ravensberg, Laurent Ravera, Carl Reintsema, Kazuhiro Sakai, Stephen Smith, Nicholas Wakeham, Henk van Weers, Doreen Wernicke, Michael Witthoeft

摘要:

我们为Athena X-IFU检测链提供了一个测试平台,该平台将作为X-IFU代表性端到端检测和读出链的首次演示,使用未来飞行电子设备和当前可用子系统的原型。这个测试台,安置在一个商业两阶段的ADR低温恒温器,包括一个焦平面阵列放置在50 mK的ADR冷阶段与过渡边缘传感器微量热光谱仪和相关的冷读出电子千像素阵列。X-IFU的原型室温电子设备提供读数,并将随着时间的推移而发展,以更能代表X-IFU任务基线。该测试台产生了关于子系统设计和接口的关键反馈,特别是温读出电子设备,并将提供一个内部检测系统,用于继续测试和开发温读出电子设备以及验证X射线校准源。在本文中,我们描述了测试台的子系统和设计,低温恒温器的特性,以及该项目的现状。

英文摘要:

We present a test platform for the Athena X-IFU detection chain, which will serve as the first demonstration of the representative end-to-end detection and readout chain for the X-IFU, using prototypes of the future flight electronics and currently available subsystems. This test bench, housed in a commercial two-stage ADR cryostat, includes a focal plane array placed at the 50 mK cold stage of the ADR with a kilopixel array of transition-edge sensor microcalorimeter spectrometers and associated cold readout electronics. Prototype room temperature electronics for the X-IFU provide the readout, and will evolve over time to become more representative of the X-IFU mission baseline. The test bench yields critical feedback on subsystem designs and interfaces, in particular the warm readout electronics, and will provide an in-house detection system for continued testing and development of the warm readout electronics and for the validation of X-ray calibration sources. In this paper, we describe the test bench subsystems and design, characterization of the cryostat, and current status of the project.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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