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arXiv 2106.09797cond-mat.mtrl-sci
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角分辨光电子能谱及其在拓扑材料中的应用

Angle-resolved photoemission spectroscopy and its application to topological materials

Baiqing Lv, Tian Qian, Hong Ding

摘要:

角分辨光电子能谱(ARPES)是一种基于光电效应的实验技术,可以说是探测固体电子结构的最有力的方法。在过去的十年中,ARPES取得了显著的进展,包括软X射线ARPES、时间分辨ARPES、自旋分辨ARPES和空间分辨ARPES的快速发展,以及能量和动量分辨率的显著提高。因此,ARPES已成为拓扑材料研究中不可或缺的实验探针,这些拓扑材料具有可以通过ARPES直接检测的特征非平凡体和表面电子结构。在过去的几年里,ARPES在拓扑材料的几个里程碑式的发现中发挥了至关重要的作用,包括拓扑绝缘体和拓扑狄拉克和外尔半金属的鉴定。在这篇技术评论中,我们评估了不同ARPES技术的最新发展,并说明了这些技术在拓扑材料研究中的应用能力。

英文摘要:

Angle-resolved photoemission spectroscopy (ARPES), an experimental technique based on the photoelectric effect, is arguably the most powerful method for probing the electronic structure of solids. The past decade has witnessed notable progress in ARPES, including the rapid development of soft-X-ray ARPES, time-resolved ARPES, spin-resolved ARPES and spatially resolved ARPES, as well as considerable improvements in energy and momentum resolution. Consequently , ARPES has emerged as an indispensable experimental probe in the study of topological materials, which have characteristic non-trivial bulk and surface electronic structures that can be directly detected by ARPES. Over the past few years, ARPES has had a crucial role in several landmark discoveries in topological materials, including the identification of topological insulators and topological Dirac and Weyl semimetals. In this Technical Review , we assess the latest developments in different ARPES techniques and illustrate the capabilities of these techniques with applications in the study of topological materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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