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arXiv 2106.05035cond-mat.mes-hall
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单层WSe $_2$中的暗激子-激子湮灭

Dark exciton-exciton annihilation in monolayer WSe$_2$

Daniel Erkensten, Samuel Brem, Koloman Wagner, Roland Gillen, Raul Perea-Causin, Jonas D. Ziegler, Takashi Taniguchi, Kenji Watanabe, Janina Maultzsch, Alexey C… 展开作者

Daniel Erkensten, Samuel Brem, Koloman Wagner, Roland Gillen, Raul Perea-Causin, Jonas D. Ziegler, Takashi Taniguchi, Kenji Watanabe, Janina Maultzsch, Alexey Chernikov, Ermin Malic

摘要:

过渡金属二硫属化物(TMD)半导体中异常强的库仑相互作用产生了由亮激子态和暗激子态组成的丰富的激子景观。在高密度下,激子可以通过激子-激子湮灭(EEA)相互作用,这是一种限制光电应用效率的类俄歇复合过程。虽然EEA是一个众所周知的和特别重要的过程,在原子薄的半导体确定激子寿命和影响运输在高密度,其微观起源仍然难以捉摸。在这个联合的理论实验研究相结合的微观和材料特定的理论与时间和温度分辨的光致发光测量,我们证明了黑暗的谷间状态,发现占主导地位的EEA率在单层WSe $_2$的关键作用。我们揭示了一个有趣的,在这类材料的俄歇散射的特性温度依赖性与理论和实验之间的良好协议。我们的研究提供了微观的洞察技术相关的俄歇散射通道内显着的激子景观的原子薄半导体的效率。

英文摘要:

The exceptionally strong Coulomb interaction in semiconducting transition-metal dichalcogenides (TMDs) gives rise to a rich exciton landscape consisting of bright and dark exciton states. At elevated densities, excitons can interact through exciton-exciton annihilation (EEA), an Auger-like recombination process limiting the efficiency of optoelectronic applications. Although EEA is a well-known and particularly important process in atomically thin semiconductors determining exciton lifetimes and affecting transport at elevated densities, its microscopic origin has remained elusive. In this joint theory-experiment study combining microscopic and material-specific theory with time- and temperature-resolved photoluminescence measurements, we demonstrate the key role of dark intervalley states that are found to dominate the EEA rate in monolayer WSe$_2$. We reveal an intriguing, characteristic temperature dependence of Auger scattering in this class of materials with an excellent agreement between theory and experiment. Our study provides microscopic insights into the efficiency of technologically relevant Auger scattering channels within the remarkable exciton landscape of atomically thin semiconductors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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