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arXiv 2104.07088cond-mat.mes-hallcond-mat.other
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氧化石墨烯的焦耳热原位还原及电导率的透射电子显微镜测量

In-situ reduction by Joule heating and measurement of electrical conductivity of graphene oxide in a transmission electron microscope

Simon Hettler, David Sebastian, Mario Pelaez-Fernandez, Ana M. Benito, Wolfgang K. Maser, Raul Arenal

摘要:

使用原位透射电子显微镜(TEM)通过焦耳加热还原氧化石墨烯(GO)。该方法允许同时研究的GO导电性的电气测量和其组成和结构特性,在整个还原过程中,通过TEM,电子衍射和电子能量损失谱。在低施加电流下观察到的GO性质的小变化归因于扩散过程的促进。实际的还原过程从施加的功率密度约2 × 1014 Wm-3开始,并以高度均匀和局部化的方式发生。电导率增加超过4个数量级,达到3 103 Sm-1的值,最终O含量小于1%。我们讨论了热退火和焦耳加热还原之间的差异。

英文摘要:

Graphene oxide (GO) is reduced by Joule heating using in-situ transmission electron microscopy (TEM). The approach allows the simultaneous study of GO conductivity by electrical measurements and of its composition and structural properties throughout the reduction process by TEM, electron diffraction and electron energy-loss spectroscopy. The small changes of GO properties observed at low applied electric currents are attributed to the promotion of diffusion processes. The actual reduction process starts from an applied power density of about 2 1014 Wm-3 and occurs in a highly uniform and localized manner. The conductivity increases more than 4 orders of magnitude reaching a value of 3 103 Sm-1 with a final O content of less than 1%. We discuss differences between the reduction by thermal annealing and Joule heating.

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