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arXiv 0803.2470cond-mat.mes-hall

Nanomachining of mesoscopic graphite

P. Barthold, T. Luedtke, R. J. Haug

英文摘要:

An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed.

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