亚开尔文温度下金属电阻中的电子加热
Electron heating in metallic resistors at sub-Kelvin temperature
摘要：
在焦耳加热的存在下，放置在亚开尔文温度下的金属电阻器中的电子温度可以显著超过声子温度。电子冷却主要通过两个过程进行：电子扩散到连接线和电子-声子耦合。本文的目的是提出一个一般的解决方案的问题，在一种形式，可以很容易地在实际情况中使用。作为一个应用程序，我们计算两个量，取决于电子温度分布：第二和第三累积量的电流噪声在零频率，作为跨电阻的电压的函数。我们还考虑时间相关的加热，一个相关的实验中，电流脉冲使用的问题，例如在时间分辨量热实验。
英文摘要：
In the presence of Joule heating, the electronic temperature in a metallic resistor placed at sub-Kelvin temperatures can significantly exceed the phonon temperature. Electron cooling proceeds mainly through two processes: electronic diffusion to and from the connecting wires and electron-phonon coupling. The goal of this paper is to present a general solution of the problem, in a form that can easily be used in practical situations. As an application, we compute two quantities that depend on the electronic temperature profile: the second and the third cumulant of the current noise at zero frequency, as a function of the voltage across the resistor. We also consider time dependent heating, an issue relevant for experiments in which current pulses are used, for instance in time-resolved calorimetry experiments.
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