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arXiv 2103.12406cond-mat.stat-mechcond-mat.soft
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最近邻连通性理论:连续渗流的一般方法

Nearest-neighbor connectedness theory: A general approach to continuum percolation

Fabian Coupette, René de Bruijn, Petrus Bult, Shari Finner, Mark A. Miller, Paul van der Schoot, Tanja Schilling

摘要:

我们介绍了一种方法来估计连续渗流阈值,并说明其有用性,通过调查几何渗流的非相互作用的线段和磁盘在两个空间维度。这些实施例用作薄膜复合材料中细长和扁平纳米填料的电渗透的模型。虽然标准的接触体积参数及其在连通性渗流理论的扩展产生准确的预测细长的纳米填料在三维,他们不能这样做,在两个维度,使我们的测试是严格的。事实上,无论是对标准论点进行系统的逐阶修正,还是调用Percus-Yevick近似的连通性版本,都不会对这两种粒子产生显著的改进。利用简单的几何考虑,我们的新方法预测的渗流阈值$ρ_c l^2 \approx 5.83$的长度$l$,这是接近蒙特卡罗模拟中发现的$ρ_c l^2 \approx 5.64$的段。对于面积为$a$的圆盘,我们发现$ρ_c a \approx 1.00$接近于$ρ_c a \approx 1.13$的Monte Carlo结果。我们讨论了传统方法的缺点,并解释了如何使用最近邻分布在我们的新方法绕过这些并发症。

英文摘要:

We introduce a method to estimate continuum percolation thresholds and illustrate its usefulness by investigating geometric percolation of non-interacting line segments and disks in two spatial dimensions. These examples serve as models for electrical percolation of elongated and flat nanofillers in thin film composites. While the standard contact volume argument and extensions thereof in connectedness percolation theory yield accurate predictions for slender nanofillers in three dimensions, they fail to do so in two dimensions, making our test a stringent one. In fact, neither a systematic order-by-order correction to the standard argument nor invoking the connectedness version of the Percus-Yevick approximation yield significant improvements for either type of particle. Making use of simple geometric considerations, our new method predicts a percolation threshold of $ρ_c l^2 \approx 5.83$ for segments of length $l$, which is close to the $ρ_c l^2 \approx 5.64$ found in Monte Carlo simulations. For disks of area $a$ we find $ρ_c a \approx 1.00$, close to the Monte Carlo result of $ρ_c a \approx 1.13$. We discuss the shortcomings of the conventional approaches and explain how usage of the nearest-neighbor distribution in our new method bypasses those complications.

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