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arXiv 2103.10382cond-mat.mes-hallquant-ph
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技术评论:纳米级弱磁场模式成像及其在2D材料中的应用

Technical Review: Imaging weak magnetic field patterns on the nanometer-scale and its application to 2D materials

Estefani Marchiori, Lorenzo Ceccarelli, Nicola Rossi, Luca Lorenzelli, Christian L. Degen, Martino Poggio

摘要:

磁化和电流密度的纳米级成像是破译各种新的和知之甚少的凝聚态现象背后的机制的关键。最近发现的原子分层材料中的相关态,如扭曲的双层石墨烯或范德华异质结构是值得注意的例子。这些状态的表现形式从超导性到高度绝缘状态,再到磁性。它们的脆弱性和对空间不均匀性的敏感性限制了它们的宏观表现,并使传统的运输或磁化测量复杂化,这些测量在整个样品上进行积分。相反,用于以高空间分辨率成像弱磁场图案的技术通过测量由磁化和电流密度产生的局部场来克服不均匀性。这种成像技术已经显示了扭曲双层石墨烯中相关态对扭曲角无序的脆弱性,并揭示了量子霍尔边缘态中复杂的电流流动。在这里,我们回顾了最适合于此类系统的调查的最先进的技术,因为它们结合了最高的磁场灵敏度与最高的空间分辨率和微创:磁力显微镜,扫描超导量子干涉器件显微镜,扫描氮空位中心显微镜。我们比较这些技术的能力,他们所需的操作条件,并评估其适用性不同类型的源对比度,特别是磁化和电流密度。最后,我们重点介绍了改进每种技术的前景,并推测其潜在的影响,特别是在快速增长的二维(2D)材料领域。

英文摘要:

Nanometer-scale imaging of magnetization and current density is the key to deciphering the mechanisms behind a variety of new and poorly understood condensed matter phenomena. The recently discovered correlated states hosted in atomically layered materials such as twisted bilayer graphene or van der Waals heterostructures are noteworthy examples. Manifestations of these states range from superconductivity, to highly insulating states, to magnetism. Their fragility and susceptibility to spatial inhomogeneities limits their macroscopic manifestation and complicates conventional transport or magnetization measurements, which integrate over an entire sample. In contrast, techniques for imaging weak magnetic field patterns with high spatial resolution overcome inhomogeneity by measuring the local fields produced by magnetization and current density. Already, such imaging techniques have shown the vulnerability of correlated states in twisted bilayer graphene to twist-angle disorder and revealed the complex current flows in quantum Hall edge states. Here, we review the state-of-the-art techniques most amenable to the investigation of such systems, because they combine the highest magnetic field sensitivity with the highest spatial resolution and are minimally invasive: magnetic force microscopy, scanning superconducting quantum interference device microscopy, and scanning nitrogen-vacancy center microscopy. We compare the capabilities of these techniques, their required operating conditions, and assess their suitability to different types of source contrast, in particular magnetization and current density. Finally, we focus on the prospects for improving each technique and speculate on its potential impact, especially in the rapidly growing field of two-dimensional (2D) materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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