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arXiv 2011.14803cond-mat.mes-hall
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硅纳米三明治结构分数电导的相位控制

Phase control of the fractional conductance of silicon nanosandwich-structures

N. I. Rul, N. T. Bagraev, L. E. Klyachkin, A. M. Malyarenko

摘要:

我们提出的实验数据的电特性的硅纳米andwichstructures获得的硅平面技术在霍尔几何结构的框架,代表的超浅硅量子阱的2 nm宽,被限制在三角形势垒重掺杂硼,创建边缘通道用作电信号的相位控制器。负U偶极硼中心的形成,似乎限制了边缘通道,导致有效质量下降和电子-电子相互作用的相应减少,从而在高温至室温下引起宏观量子现象。纵向电导的相位控制通过改变源漏电流的大小或施加到量子法拉第效应内的硅纳米线的外部栅极的电压来观察。

英文摘要:

We present the experimental data of the electric features of the silicon nanosandwichstructures obtained by silicon planar technology in the frameworks of the Hall geometry that represent the ultra-shallow silicon quantum well of 2 nm wide that are confined by delta-barrier heavily doped with boron, which create the edge channels used as the phase controllers of electric signals. The formation of the negative-U dipole boron centers, which appear to confine the edge channels, results in the effective mass dropping and corresponding reduction of the electron-electron interaction thereby giving rise to the macroscopic quantum phenomena at high temperatures up to room temperature. The phase control of the longitudinal conductance is observed by changing either the magnitude of the source-drain current or the voltage applied to the external gate of the silicon nanosandwiches within the quantum Faraday effect.

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