arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2009.01170physics.opticsphysics.app-ph
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通过固有像差校准的精确定位显微术

Accurate localization microscopy by intrinsic aberration calibration

Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, Samuel M. Stavis

摘要:

一个标准的范例,本地化显微镜涉及扩展从二维到三维的工程信息到发射器的图像,和近似的光学像差的场依赖性所产生的误差。我们颠倒了这个标准的范例,引入的概念,充分利用潜在的信息的内在像差的综合校准的普通显微镜,使准确定位的单发射器在整个超宽和深的领域在三维空间。为了完成从微尺度机构,从成像基板到微系统技术的空间信息的提取,我们引入了一个协同的概念,刚性变换的多个发射器的位置在三维空间,提高精度,测试精度,并产生测量在六个自由度。我们的研究阐明了在本地化显微镜的像差效应的挑战,重新定义的挑战作为一个机会,准确,精确和完整的定位,并阐明了一个复杂的微机电系统的性能和可靠性。

英文摘要:

A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard paradigm, introducing the concept of fully exploiting the latent information of intrinsic aberrations by comprehensive calibration of an ordinary microscope, enabling accurate localization of single emitters in three dimensions throughout an ultrawide and deep field. To complete the extraction of spatial information from microscale bodies ranging from imaging substrates to microsystem technologies, we introduce a synergistic concept of the rigid transformation of the positions of multiple emitters in three dimensions, improving precision, testing accuracy, and yielding measurements in six degrees of freedom. Our study illuminates the challenge of aberration effects in localization microscopy, redefines the challenge as an opportunity for accurate, precise, and complete localization, and elucidates the performance and reliability of a complex microelectromechanical system.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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