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arXiv 2008.10672cond-mat.mes-hallphysics.ins-det
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任意位置五点接触无限大薄板薄层电阻的确定

Determination of the sheet resistance of an infinite thin plate with five point contacts located at arbitrary positions

Krzysztof R. Szymański, Piotr A. Zaleski

摘要:

本文报道了一种与探针位置无关的五探针薄层电阻测量方法。该方法对无限均匀平面是严格的。它作为基于平面分子层的薄层电阻标准具有潜在的应用。该方法可用于测量覆盖具有球形拓扑结构的物体的层的薄层电阻,特别是在难以控制探针定位的微米和纳米尺度上。

英文摘要:

In this paper, a five-probe method of sheet resistance measurement that is independent of probe positions is reported. The method is strict for an infinite homogeneous plane. It has potential applications as a sheet resistance standard based on planar molecular layers. The method can be used to measure the sheet resistance of layers covering objects with a spherical topology, particularly on micro- and nanometric scales, where it is difficult to control probe positioning.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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