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arXiv 1909.04097cond-mat.mtrl-sci
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从(Ti,Zr)2AlC化合物靶材沉积含MAX相薄膜

Deposition of MAX phase containing thin films from a (Ti,Zr)2AlC compound target

Clio Azina, Bensu Tunca, Andrejs Petruhins, Binbin Xin, Melike Yildizhan, Per O. Å. Persson, Jozef Vleugels, Konstantina Lambrinou, Johanna Rosén, Per Eklund

AI总结:

本研究通过溅射沉积(Ti,Zr)2AlC靶材,在不同温度下制备含MAX相薄膜,揭示了从碳化物经铝化物到MAX相的生长机制,成功形成两种固溶体MAX相。

摘要:

本工作报告了从化合物(Ti,Zr)2AlC靶材进行的溅射沉积实验,在500至900°C的温度范围内,于MgO(111)和Al2O3(0001)衬底上沉积了含Al的(Ti,Zr)C薄膜(厚度30-40 nm)。碳化物结构中Al的存在通过晶格参数变化得到证实。此外,化学分析表明Al在整个薄膜厚度中的分布相当均匀。从同一化合物靶材沉积的更厚薄膜(80-90 nm)在高达800°C时由准二元(Ti,Zr)C和Ti-Zr-Al体系中的金属间化合物组成,而在900°C时则形成了具有不同Ti:Zr比的固溶体MAX相。X射线衍射和透射电子显微镜显示,形成了(Ti,Zr)2AlC和(Ti,Zr)3AlC2两种固溶体MAX相。此外,本工作讨论了更厚薄膜的生长机制,该机制始于混合(Ti,Zr)C碳化物的形成,随后是铝化物的形核与生长,最终导致MAX相的形成,这是溅射沉积的主要目标。

英文摘要:

This work reports on sputter depositions carried out from a compound (Ti,Zr)2AlC target, whereupon Al-containing (Ti,Zr)C thin films (30-40 nm in thickness) were deposited on MgO(111) and Al2O3(0001) substrates at temperatures ranging between 500 and 900 °C. The presence of Al within the carbide structure was evidenced by lattice parameter variations. Furthermore, chemical analyses showed that the Al distribution throughout the film thickness was fairly homogeneous. Thicker films (80-90 nm) deposited from the same compound target consisted of the pseudo-binary (Ti,Zr)C and intermetallic compounds in the Ti-Zr-Al system up to 800 °C, as well as solid solution MAX phases with different Ti:Zr ratios at 900 °C. X-ray diffraction and transmission electron microscopy showed that both (Ti,Zr)2AlC and (Ti,Zr)3AlC2 solid solution MAX phases were formed. Moreover, this work discusses the growth mechanism of the thicker films, which started with the formation of the mixed (Ti,Zr)C carbide, followed by the nucleation and growth of aluminides, eventually leading to the formation of the MAX phases, which was the primary objective of the sputter depositions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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