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arXiv 1907.06211cond-mat.supr-concond-mat.str-el
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用X射线光电子能谱和吸收谱研究T ′-La1- xEu0.2SrxCuO_4中载流子掺杂的性质

Nature of carrier doping in T'-La1.8-xEu0.2SrxCuO4 studied by X-Ray Photoemission and Absorption Spectroscopy

Chun Lin, Masafumi Horio, Takayuki Kawamata, Shin Saito, Keisuke Koshiishi, Shoya Sakamoto, Yujun Zhang, Kohei Yamamoto, Keisuke Ikeda, Yasuyuki Hirata, Kou Tak… 展开作者

Chun Lin, Masafumi Horio, Takayuki Kawamata, Shin Saito, Keisuke Koshiishi, Shoya Sakamoto, Yujun Zhang, Kohei Yamamoto, Keisuke Ikeda, Yasuyuki Hirata, Kou Takubo, Hiroki Wadati, Akira Yasui, Yasumasa Takagi, Eiji Ikenaga, Tadashi Adachi, Yoji Koike, Atsushi Fujimori

摘要:

近年来,空穴掺杂的T '结构La_(1.8-x)Eu_(0.2)Sr_xCuO_4(LESCO)超导材料引起了人们的广泛关注。我们已经进行了X射线光电子能谱和吸收光谱测量生长和减少T0-LESCO。结果表明,还原退火和Sr置换分别对电子和空穴进行了掺杂。然而,它表明,该系统仍然在电子掺杂侧的莫特绝缘体或电荷转移间隙崩溃的母体化合物。

英文摘要:

Recently, hole-doped superconducting cuprates with the T'-structure La1.8-xEu0.2SrxCuO4 (LESCO) have attracted a lot of attention. We have performed x-ray photoemission and absorption spectroscopy measurements on as-grown and reduced T0-LESCO. Results show that electrons and holes were doped by reduction annealing and Sr substitution, respectively. However, it is shown that the system remains on the electron-doped side of the Mott insulator or that the charge-transfer gap is collapsed in the parent compound.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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