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arXiv 1906.07352physics.app-ph
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波长扩展InGaAsBi光电探测器的深能级分析

Deep levels analysis in wavelength extended InGaAsBi photodetector

Jian Huang, Baile Chen, Zhuo Deng, Yi Gu, Yingjie Ma, Jian Zhang, Xiren Chen, Jun Shao

摘要:

InP基稀铋化物InGaAsBi材料是一种很有前途的短波红外探测材料。限制这些InGaAsBi光电二极管性能的一个关键因素是由材料内的缺陷引起的暗电流。在这项工作中,低频噪声光谱(LFNS)和温度变化的光致发光被用来表征在器件中的缺陷水平。从LFNS光谱中识别出位于Ec-0.33 eV、Ev +0.14 eV和Ec-0.51 eV的三个深能级,这与通过InGaAsBi的光致发光光谱发现的发射峰能量一致。

英文摘要:

InP based dilute Bismide InGaAsBi material is emerging as a promising candidate for extending short wavelength infrared detection. One critical factor to limit the performance of these InGaAsBi photodiodes is dark current caused by defects within the material. In this work, low frequency noise spectroscopy (LFNS) and temperature varied photoluminescence was used to characterize the defect levels in the devices. Three deep levels located at Ec -0.33 eV, Ev +0.14 eV, and Ec -0.51 eV were identified from the LFNS spectra, which are consistent with emission peak energy found by photoluminescence spectra of InGaAsBi.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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