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arXiv 1901.06989physics.opticscond-mat.mtrl-sci
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hBN中光学活性缺陷的宽场光谱超分辨成像

Wide-field spectral super-resolution mapping of optically active defects in hBN

Jean Comtet, Evgenii Glushkov, Vytautas Navikas, Jiandong Feng, Vitaliy Babenko, Stephan Hofmann, Kenji Watanabe, Takashi Taniguchi, Aleksandra Radenovic

摘要:

点缺陷会对材料的机械、电子和光学性能产生重大影响。因此,从建立集成的纳米光子技术到材料生长优化,发展稳健的、多维的、高通量的和大规模的缺陷表征技术至关重要。在这里,我们展示了潜在的宽场光谱单分子定位显微镜(光谱SMLM)的合奏光谱特性的确定,以及表征的空间,光谱和时间的单一缺陷CVD生长和辐照剥离六方氮化硼(hBN)材料的动态。我们表征了我们的样品的异质性光谱响应,并确定至少两种类型的CVD生长的材料中的缺陷,而辐照剥离片主要显示只有一种类型的缺陷。我们分析了每种类型的缺陷的闪烁动力学和光谱发射,并讨论了它们的影响与我们的样品所观察到的光谱异质性。我们的研究显示了宽场光谱SMLM技术在材料科学中的潜力,并为缺陷性质的定量多维映射铺平了道路。

英文摘要:

Point defects can have significant impacts on the mechanical, electronic and optical properties of materials. The development of robust, multidimensional, high-throughput and large-scale characterization techniques of defects is thus crucial, from the establishment of integrated nanophotonic technologies to material growth optimization. Here, we demonstrate the potential of wide-field spectral single-molecule localization microscopy (spectral SMLM) for the determination of ensemble spectral properties, as well as characterization of spatial, spectral and temporal dynamics of single defects in CVD-grown and irradiated exfoliated hexagonal boron-nitride (hBN) materials. We characterize the heterogeneous spectral response of our samples, and identify at least two types of defects in CVD-grown materials, while irradiated exfoliated flakes show predominantly only one type of defect. We analyze the blinking kinetics and spectral emission for each type of defects, and discuss their implications with respect to the observed spectral heterogeneity of our samples. Our study shows the potential of wide-field spectral SMLM techniques in material science and paves the way towards quantitative multidimensional mapping of defect properties.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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